FT-IR spectroscopy is the ideal application when it comes to the identification of impurities on components, etc. Through a powerful library, with several hundred of thousands of comparisons, foreign substances can easily be identified and assigned. The use of a FT-IR microscope permits the identification of very small specimen, a multi-layered material structure, as well as the determination of the distribution of substances in a material.
Here we would like to show you some selected examples of the possibilities of FT-IR spectroscopy:
Observation of reaction rates (e.g. curing of a resin-based adhesive)
Distribution of a substance in a matrix by means of IR mapping
Determination of impurities of a component or contamination
Inspection of delivered materials in quality control